Automatically tracing the surface of the material to be processed is a great challenge, which requires an AI vision recognition function simultaneously with targeted algorithms. We need to consider the response of material itself to laser (e.g. whether it is highly reflective or it is fluorescent etc.) and the material modification after being irradiated by laser (e.g. modulation of refractive index and amplitude). Therefore, it is necessary to implement tracing functions accordingly based on different mechanisms and different materials. Here we provide an example of photoreduction processing on graphene oxide films: First, graphene oxide has a relatively high refractive index (>1.8), thus we can determine whether the laser focus is on the surface of the graphene oxide film by detecting the reflected light pattern through machine vision. Meanwhile, we can determine the performance of laser focus on the film surface by looking at the amplitude modulation caused by laser fabrication, and we can also determine whether the laser is in the best position by judging its processing resolution. Additionally, here we demand excellence not just in software but also in hardware. Design and calibration of the laser device is necessary to achieve the best imaging quality and highest imaging resolution. Surface tracing is a systems engineering task and this is just a case of processing graphene oxide films. It is a complicated topic that is constantly changing according to requirements of different materials. Innofocus is an expert in this field and holds patents for relevant inventions. Do not hesitate to enquire with more specific demands.
Refractive index imaging is a method of quantifying the phase difference caused by difference in refractive index using computational holography, through spatial light interference, which further reproduces the three-dimensional refractive index distribution of the measured material. To measure the 3D refractive index, the material to be measured first needs to have a high transmittance in the wavelength region of the laser to be used. (Innofocus provides laser of multiple wavelength options including 450nm, 488nm, 532nm, 633nm etc., and can customize laser wavelength to be used according to customer requirement.) Therefore, in theory, the refractive index imaging can be performed as long as the material is transparent to the laser wavelength used. However, in practice, due to the need for high numerical aperture lenses (NA>0.5) to achieve high spatial resolution, there are certain requirements for the thickness of the material to be imaged. The thickness should be less than 2 mm and the distance from the fabricated structure to the material surface should be less than the working distance of the imaging microscope lens (typically <400 µm). Since the refractive index difference and spatial distribution are the same when processed with the same laser parameters on the same material, we can perform refractive index imaging on the materials in thin sheet first to quantify refractive index, optimize laser processing parameters, and use the optimized parameters on the final thick blocks of the materials. This allows for quick optimization of processing parameters and can be used on block materials of different thicknesses depending on the application requirements.
The biggest advantage of using a spatial light modulator (SLM) for aberration correction is that it can dynamically update the phase diagram (basic frequency is around 60Hz, while customization can go up to 500Hz). Innofocus’s nanofabrication system have unique technical advantages in terms of light field modulation. For example, our software system can generate phase maps for aberration correction in real time, based on the processing depth calculated after locating the material surface, and quickly update them on the spatial light modulator to achieve optimal compensation for each processing depth. Furthermore, since the laser focal spot runs along a specific designed trajectory in 3D space during the processing, it may move continuously at different depths. We designed AI-assisted software system to realize real-time compensation according to the depth where the focal spot is located during the continuous processing, to ensure quality and consistency.
To the best of our knowledge, Innofocus's commercialized nanofabrication equipment based on multiple patented technologies is the world first system to ever achieve in-situ laser nanofabrication characterization of three-dimensional refractive index distribution, which is a fundamental breakthrough in the field of laser processing. The traditional method of refractive index measurement by refractive index liquid is very time-consuming and laborious, and can only perform two-dimensional refractive index characterization, but not three-dimensional refractive index characterization.
The area that inscribed affects FBG’s performance. Therefore, it is especially important to increase the FBG inscribed area for large core diameter fibers. There are two methods to increase the FBG inscribed area:
Innofocus's NanoPrint 3D Intelligent Laser Nano-fabrication System.
Reconstruction of refractive index consists of two steps:
This depends on the system configuration. For example, Innofocus’ standard SLM achieves a maximum power of 800 mW/cm2. Thus, depending on the SLM irradiated area, the maximum power is 1.06 W. If set higher customised SLMs, 2 W/cm2 can be achieved with a maximum power reaching 2.654 W.
The central zero stage of SLM can be resulted in two ways, depending on the scenarios:
The most important purpose of using in-situ 3D refractive index reconstruction is to understand the refractive index difference resulting from the interaction between the femtosecond laser and the material. In addition, 3D refractive index reconstruction after laser processing not only measures the refractive index difference at the point of femtosecond laser interaction, but also demonstrates the entire specific morphology and spatial distribution of the laser-processed 3D structure, providing important information in line widths, positions, cross sections, etc.
Surface tracing performs in real time. The speed of the process is determined by the sampling speed and frequency. The goal surface tracing is to keep the focal point on the surface of the substrate during processing by compensating for the focal point offset in real time. Surface tracing can further output the real-time position of the focal point, which can reconstruct the entire surface profile. This function can be used to design the 3D position of the entire multi-focus array for multi-focus machining.
In the multi-focus scenario, in order to track each focus, the 3D spatial distribution of the entire multifocal array needs to be updated in real time, so that the multifocal array can be updated by refining the phase modulation. Ideally, this method is feasible. However, this process requires intensive computer computation, and the current computer capability is not prepared to enable the real-time surface tracing of multifocal arrays.
Uniformity of focus in multi-focus machining is the key to achieving high quality parallel machining. Therefore, the requirement for uniformity is extremely high, and the optimisation algorithm can achieve more than 99% uniformity.
Uniformity of focus in multi-focus machining is the key to achieving high quality parallel machining. Therefore, the requirement for uniformity is extremely high, and the optimisation algorithm can achieve more than 99% uniformity.
Innofocus Photonics Technology Pty Ltd
Unit 10/17 Helen Street, Heidelberg West 3081, Victoria, Australia
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